Optimum Times for Step-Stress Cumulative Exposure Model Using Log-Logistic Distribution with Known Scale Parameter
DOI:
https://doi.org/10.17713/ajs.v38i1.260Abstract
In this paper we assume that the life time of a test unit follows a log-logistic distribution with known scale parameter. Tables of optimum times of changing stress level for simple step-stress plans under a cumulative exposure model are obtained by minimizing the asymptotic variance of the maximum likelihood estimator of the model parameters at the design stress with respect to the change time.References
Al-Haj Ebrahem, M., and Al-Masri, A. (2007a). Optimum simple step-stress plan for loglogistic cumulative exposure model. Metron - International Journal of Statistics, LXV, 23-34.
Al-Haj Ebrahem, M., and Al-Masri, A. (2007b). Optimum simple step-stress plans for log-logistic distribution under time censoring. Abhath AlYarmouk: Basic Sciences and Engeneering, 16, 319-327.
Alhadeed, A., and Yang, S. (2005). Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. IEEE Transactions on Reliability, 54, 64-68.
Bai, D., Kim, M., and Lee, S. (1989). Optimum simple step-stress accelerated life tests with censoring. IEEE Transactions on Reliability, 38, 528-532.
Chung, S., and Bai, D. (1998). Optimal designs of simple step-stress accelerated life tests for lognormal lifetime distributions. International Journal of Reliability, Quality
and Safety Engineering, 5, 315-336.
Gouno, E. (2001). An inference method for temperature step-stress accelerated life testing. Quality and Reliability Engineering International, 17, 11-18.
Khamis, I., and Higgins, J. (1996a). Optimum 3-step step-stress tests. IEEE Transactions on Reliability, 45, 341-345.
Khamis, I., and Higgins, J. (1996b). An alternative to the weibull step-stress model. In Proceedings of the Joint Statistics Meeting, Chicago, USA (p. 123-127). American Statistical Association.
Khamis, I., and Higgins, J. (1998). A new model for step-stress testing. IEEE Transactions on Reliability, 47, 131-134.
Miller, R., and Nelson, B. (1983). Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability, 32, 59-65.
Nelson, W. (1980). Accelerated life testing step-stress models and data analysis. IEEE Transactions on Reliability, 29, 103-108.
Nelson, W. (1990). Accelerated Testing, Statistical Models, Test Plans, and Data Analysis. New York: Wiley.
Schmoyer, R. (1991). Nonparametric analysis for two-level single-stress accelerated life tests. Technometrics, 33, 175-186.
Xiong, C. (1998). Inferences on a simple step-stress model with type-II censored exponential data. IEEE Transactions on Reliability, 47, 142-146.
Xiong, C., and Milliken, G. (2002). Prediction for exponential lifetimes based on stepstress testing. Communications in Statistics – Simulation and Computation, 31, 539-556.
Downloads
Published
Issue
Section
License
The Austrian Journal of Statistics publish open access articles under the terms of the Creative Commons Attribution (CC BY) License.
The Creative Commons Attribution License (CC-BY) allows users to copy, distribute and transmit an article, adapt the article and make commercial use of the article. The CC BY license permits commercial and non-commercial re-use of an open access article, as long as the author is properly attributed.
Copyright on any research article published by the Austrian Journal of Statistics is retained by the author(s). Authors grant the Austrian Journal of Statistics a license to publish the article and identify itself as the original publisher. Authors also grant any third party the right to use the article freely as long as its original authors, citation details and publisher are identified.
Manuscripts should be unpublished and not be under consideration for publication elsewhere. By submitting an article, the author(s) certify that the article is their original work, that they have the right to submit the article for publication, and that they can grant the above license.
How to Cite
